A new concept for detecting positive ions in high-pressure TPCs is presented. The basic process is ion-induced secondary electron emission, followed by electroluminescence-based imaging of the emitted electrons. Applied to high pressure xenon, the new idea may enable reconstructing with high accuracy the topology of candidate neutrinoless double beta decay events of Xe-136 with minimal diffusion-induced smearing. Unlike other approaches it will enable doing so in future ton-scale experiments without sacrificing the superb energy resolution required for detecting this extremely rare process. Other applications may include directional dark matter searches and nano-dosimetry. Candidate surfaces are discussed, as well as the expected efficiencies and potential pitfalls.