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Surface Science Laboratory of Technion – your address for surface samples characterization
Tatyana Kravchuk , Kamira Cohen-Weinfeld
Solid State Institute of Technion
The Surface Science Laboratory, established in 1980, serves as a center for basic and applied research in the field of surface and thin film physics and chemistry. The laboratory is actually equipped with:
- A Time of Flight Secondary Ion Mass Spectroscopy - TOF.SIMS 5 from IONTOF GmbH (installed in 2007) system. TOF-SIMS provides detailed and very sensitive elemental and molecular information about surfaces, thin layers, interfaces, and full 3D analysis of the samples.
- An X-Ray Photoelectron Spectroscopy - VersaProbe III by PHI Physical Electronics (installed in 2017) system. XPS provides a quantitative atomic chemical composition of solid surfaces with chemical bonding information for surfaces, thin layers, interfaces, bulk and powder materials.
On the poster we will present the principles of these two techniques, their abilities and their powerful advantages for surface science characterization.