The Israel Physical Society
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2020 IPS Conference
Study Materials
Corporate Members
Home
About/Contact
Newsletters
Events/Seminars
2020 IPS Conference
Study Materials
Corporate Members
Lecture Time | Speaker | Lecture subject |
---|---|---|
16:15-16:45 | Yanir Hainick |
Sub-nanometer Sensing with Spectral Reflectometry Developments in semi-conductor industry raise the need for accurate measurements of nanometer-scale structures. |
16:45-17:15 | Moty Dotan |
Thermal Lock-In technique Thermal imaging becomes more and more important not only for contactless temperature distribution measurements (“passive... |
17:15-17:45 | Amnon Manassen |
Sub-nanometer metrology with visible light microscope When using an optical system, it is impossible to see features much smaller than the shortest wavelength used. |